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IEC 61937-5 Ed. 2.1 en:2019 Digital audio - Interface for non-linear PCM encoded audio bitstreams applying IEC 60958 - Part 5: Non-linear PCM bitstreams according to the DTS (Digital Theater Systems) format(s) CONSOLIDATED EDITION
IEC 62271-109 Ed. 3.0 b:2019 High-voltage switchgear and controlgear - Part 109: Alternating-current series capacitor by-pass switches standard by International Electrotechnical...
IEC 62433-1 Ed. 1.0 en:2019 EMC IC modelling - Part 1: General modelling framework standard by International Electrotechnical Commission, 03/08/2019
IEC 61892-5 Ed. 4.0 b:2019 Mobile and fixed offshore units - Electrical installations - Part 5: Mobile units standard by International Electrotechnical Commission, 04/09/2019 ...
IEC 62386-220 Ed. 1.0 b:2019 Digital addressable lighting interface - Part 220: Particular requirements for control gear - Centrally supplied emergency operation (device type 19) standard by
IEC 61156-11 Ed. 1.0 en:2019 Multicore and symmetrical pair/quad cables for digital communications - Part 11: Symmetrical single pair cables with transmission characteristics up to 600 MHz - Horizontal floor wiring - Sectional specification
IEC 60898-3 Ed. 1.0 en:2019 Electrical accessories - Circuit-breakers for overcurrent protection for household and similar installations - Part 3: Circuit-breakers for DC operation standard by
IEC 60674-2 Ed. 2.1 b:2019 Specification for plastic films for electrical purposes - Part 2: Methods of test CONSOLIDATED EDITION standard by International Electrotechnical Commission,...
IEC 60255-181 Ed. 1.0 b:2019 Measuring relays and protection equipment - Part 181: Functional requirements for frequency protection standard by International Electrotechnical...
IEC 60384-17 Ed. 3.0 b:2019 Fixed capacitors for use in electronic equipment - Part 17: Sectional specification - Fixed metallized polypropylene film dielectric AC and pulse capacitors standard by
IEC 60122-4 Ed. 1.0 b:2019 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors standard by International Electrotechnical Commission, 01/24/2019 ...
IEC 63068-1 Ed. 1.0 en:2019 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects standard by
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