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IEEE 1100 : 2005 POWERING AND GROUNDING ELECTRONIC EQUIPMENT Institute of Electrical & Electronics Engineers
IEEE C57.146 : 2005 INTERPRETATION OF GASES GENERATED IN SILICONE-IMMERSED TRANSFORMERS Institute of Electrical & Electronics Engineers
IEEE C37.92 : 2005 ANALOG INPUTS TO PROTECTIVE RELAYS FROM ELECTRONIC VOLTAGE AND CURRENT TRANSDUCERS Institute of Electrical & Electronics Engineers
IEEE C57.13-6 : 2005 HIGH-ACCURACY INSTRUMENT TRANSFORMERS Institute of Electrical & Electronics Engineers
IEEE 1650 : 2005 TEST METHODS FOR MEASUREMENT OF ELECTRICAL PROPERTIES OF CARBON NANOTUBES Institute of Electrical & Electronics Engineers
IEEE 421.5 : 2005 RECOMMENDED PRACTICE FOR EXCITATION SYSTEM MODELS FOR POWER SYSTEM STABILITY STUDIES Institute of Electrical & Electronics Engineers
IEEE 1268 : 2005 SAFETY IN THE INSTALLATION OF MOBILE SUBSTATION EQUIPMENT Institute of Electrical & Electronics Engineers
IEEE C37.66 : 2005 REQUIREMENTS FOR CAPACITOR SWITCHES FOR AC SYSTEMS (1 KV TO 38 KV) Institute of Electrical & Electronics Engineers
IEEE 820 : 2005 TELEPHONE LOOP PERFORMANCE CHARACTERISTICS Institute of Electrical & Electronics Engineers
IEEE 1450.1 : 2005 EXTENSIONS TO STANDARD TEST INTERFACE LANGUAGE (STIL) (IEEE STD 1450TM-1999) FOR SEMICONDUCTOR DESIGN ENVIRONMENTS Institute of Electrical & Electronics Engineers
IEEE 1450.6 : 2005 STANDARD TEST INTERFACE LANGUAGE (STIL) FOR DIGITAL TEST VECTOR DATA - CORE TEST LANGUAGE (CTL) Institute of Electrical & Electronics Engineers
IEEE 1554 : 2005 INERTIAL SENSOR TEST EQUIPMENT, INSTRUMENTATION, DATA ACQUISITION, AND ANALYSIS Institute of Electrical & Electronics Engineers
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