IEC 60749-17 Ed. 2.0 b:2019
IEC 60749-17 Ed. 2.0 b:2019 Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
standard by International Electrotechnical Commission, 03/28/2019
Full Description
IEC 60749-17 is used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.Cart
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Specials
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AS/NZS 1050.8:1994
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