Full Description

This part of IEC 60747 specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.

All current amendments available at time of purchase are included with the purchase of this document.

Product Details

Published: 06/07/2019 ISBN(s): 9780580957796 Number of Pages: 28 File Size: 1 file , 2.2 MB Product Code(s): 30348427, 30348427, 30348427 Note: This product is unavailable in United Kingdom