BS IEC 62951-6:2019

BS IEC 62951-6:2019 Semiconductor devices. Flexible and stretchable semiconductor devices. Test method for sheet resistance of flexible conducting films

standard by British Standard / International Electrotechnical Commission, 05/15/2019

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Full Description

This part of IEC 62951 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.

Cross References:
ISO 291:2008
IEC 62951-1:2017


All current amendments available at time of purchase are included with the purchase of this document.

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