Full Description

BS IEC 62951-4:2019 specifies an evaluation method of the bending fatigue properties ofconductive thin film and flexible substrate for the application at flexible semiconductor devices.The films include any films deposited or bonded onto a non-conductive flexible substrate suchas thin metal film, transparent conducting electrode, and thin silicon film used for flexiblesemiconductor devices. The electrical and mechanical behaviours of films on the substrateare evaluated. The fatigue test methods include dynamic bending fatigue test and staticbending fatigue test.

Cross References:
IEC 62047-2:2006
IEC 62047-22:2014
IEC 62047-12:2011
IEC 62715-1-1:2013
IEC 62951-1


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Product Details

Published: 03/05/2019 ISBN(s): 9780580972904 Number of Pages: 16 File Size: 1 file , 1.1 MB Product Code(s): 30355431, 30355431, 30355431 Note: This product is unavailable in United Kingdom