SAE J 2052 : 2016
SAE J 2052 : 2016
TEST DEVICE HEAD CONTACT DURATION ANALYSIS
SAE International
TEST DEVICE HEAD CONTACT DURATION ANALYSIS
SAE International
FOREWORD
1. SCOPE
2. REFERENCES
3. DEFINITIONS
4. DATA ACQUISITION AND PROCESSING SYSTEM
5. PROCEDURE FOR DETERMINING HEAD CONTACT
DURATION (t[e], t[d])
6. OTHER INFORMATION
7. NOTES
Provides methods which can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
Document Type | Standard |
Status | Current |
Publisher | SAE International |