SAE J 2052 : 2016

SAE J 2052 : 2016

TEST DEVICE HEAD CONTACT DURATION ANALYSIS

SAE International

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Table of Contents

FOREWORD
1. SCOPE
2. REFERENCES
3. DEFINITIONS
4. DATA ACQUISITION AND PROCESSING SYSTEM
5. PROCEDURE FOR DETERMINING HEAD CONTACT
   DURATION (t[e], t[d])
6. OTHER INFORMATION
7. NOTES

Abstract

Provides methods which can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.

General Product Information

Document Type Standard
Status Current
Publisher SAE International

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