IEEE 1804 : 2017
IEEE 1804 : 2017
FAULT ACCOUNTING AND COVERAGE REPORTING (FACR) FOR DIGITAL MODULES
Institute of Electrical & Electronics Engineers
Table of Contents
1. Overview
2. Definitions, acronyms, and abbreviations
3. Fault classification and test coverage reporting
4. Fault modeling
5. Fault accounting methods and rules
6. Summary
Annex A (informative) - Bibliography
Abstract
Specifies aspects of the stuck-at fault model as they are relevant to the generation of test patterns for digital circuits.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | Institute of Electrical & Electronics Engineers |
