IEEE 1671.6 : 2015
IEEE 1671.6 : 2015
AUTOMATIC TEST MARKUP LANGUAGE (ATML) TEST STATION DESCRIPTION
Institute of Electrical & Electronics Engineers
AUTOMATIC TEST MARKUP LANGUAGE (ATML) TEST STATION DESCRIPTION
Institute of Electrical & Electronics Engineers
1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 Schema - TestStationDescription.xsd
5 Schema - TestStationInstance.xsd
6 ATML TestStationDescription XML schema
names and locations
7 ATML XML schema extensibility
8 Conformance
Annex A (informative) - IEEE download website
material associated with this document
Annex B (informative) - User's information and
examples
Annex C (informative) - Glossary
Annex D (informative) - Bibliography
Specifies an exchange format, utilizing eXtensible Markup Language (XML), for both the static description of a test station, and the specific description of test station instance information.
Document Type | Standard |
Status | Current |
Publisher | Institute of Electrical & Electronics Engineers |