IEEE 1687 : 2014
IEEE 1687 : 2014
ACCESS AND CONTROL OF INSTRUMENTATION EMBEDDED WITHIN A SEMICONDUCTOR DEVICE
Institute of Electrical & Electronics Engineers
Table of Contents
1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 Technology
5 Hardware architecture
6 Instrument Connectivity Language (ICL)
7 Procedural Description Language (PDL): level-0
8 Procedural Description Language: level-1 (Tcl)
Annex A (informative) - ICL grammar
Annex B (informative) - PDL level-0 grammar
Annex C (informative) - PDL level-1 grammar
Annex D (informative) - PDL differences between
IEEE Std 1687-2014 and IEEE Std 1149.1-2013
Annex E (informative) - Examples
Annex F (informative) - Design guidance
Annex G (informative) - Bibliography
Abstract
Defines a methodology for access to embedded instrumentation, without defining the instruments or their features themselves, via the IEEE 1149.1 test access port (TAP) and additional signals that may be required.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | Institute of Electrical & Electronics Engineers |
