IEEE 1696 : 2013

Table of Contents

1 Overview
2 Normative references
3 Definitions, abbreviations, and acronyms
4 Special terms
5 Instrumentation
6 Test fixture
7 Performance parameters

Abstract

Gives test method(s) and specifies transfer (artifact) standards for characterizing electrical circuit probes and probes systems.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	Institute of Electrical & Electronics Engineers
Pages
ISBN