IEEE 1149.8.1 : 2012
IEEE 1149.8.1 : 2012
BOUNDARY-SCAN-BASED STIMULUS OF INTERCONNECTIONS TO PASSIVE AND/OR ACTIVE COMPONENTS
Institute of Electrical & Electronics Engineers
Table of Contents
1. Overview
2. Normative references
3. Definitions
4. Technology
5. Instructions
6. Pin implementation specifications
7. Toggle_Control register
8. Conformance and documentation requirements
Annex A (informative) - Unpowered testing for open
connections on printed circuit assemblies
Annex B (informative) - Boundary register cells that
support ST-pins and IEEE 1149.6 ac-pins
Annex C (informative) - Bibliography
Abstract
Describes extensions to IEEE 1149.1[TM] that define the boundary-scan structures and methods required to facilitate boundary-scan-based stimulus of interconnections to passive and/or active components.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | Institute of Electrical & Electronics Engineers |
