IEEE 1671.1 : 2009

Table of Contents

1. Overview
2. Normative references
3. Definitions, acronyms, and abbreviations
4. Test Description schema
5. Describing test program structure
6. Describing control flow
7. Describing data
8. Describing test behavior
9. Describing fault isolation
10. ATML Test Description XML schema names and
    locations
11. ATML XML schema extensibility
12. Conformance
Annex A (normative) - XML schemas
Annex B (informative) - TSF library examples
Annex C (informative) - Describing digital testing
Annex D (informative) - Describing serial digital bus exchanges
Annex E (informative) - IEEE download web-site material
        associated with this document
Annex F (informative) - Users information and examples
Annex G (informative) - Glossary
Annex H (informative) - Bibliography

Abstract

Specifies an exchange format, utilizing Extensible Markup Language (XML), for specifying test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a unit under test (UUT).

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	Institute of Electrical & Electronics Engineers
Pages
ISBN