IEEE 1620 : 2008
IEEE 1620 : 2008
TEST METHODS FOR THE CHARACTERIZATION OF ORGANIC TRANSISTORS AND MATERIALS
Institute of Electrical & Electronics Engineers
TEST METHODS FOR THE CHARACTERIZATION OF ORGANIC TRANSISTORS AND MATERIALS
Institute of Electrical & Electronics Engineers
1. Overview
1.1 Scope
1.2 Purpose
1.3 Electrical characterization overview
2. Definitions, acronyms, and abbreviations
2.1 Definitions
2.2 Acronyms and abbreviations
3. Standard OFET characterization procedures
3.1 Device structures
3.2 Guidelines for the OFET characterization process
3.3 Electrical standards
3.4 Reporting data
3.5 Environmental control and standards
Annex A (informative) Bibliography
Specifies a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
Document Type | Standard |
Status | Current |
Publisher | Institute of Electrical & Electronics Engineers |