IEEE 592 : 2007

IEEE 592 : 2007

EXPOSED SEMICONDUCTING SHIELDS ON HIGH-VOLTAGE CABLE JOINTS AND SEPARABLE CONNECTORS

Institute of Electrical & Electronics Engineers

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Table of Contents

1 Scope
2 Normative references
3 Performance requirements
4 Test procedures
  4.1 Test specimens
  4.2 Shield resistance
  4.3 Fault-current initiation test

Abstract

Describes design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.

General Product Information

Document Type Standard
Status Current
Publisher Institute of Electrical & Electronics Engineers
Superseded By
  • IEEE 592:2018

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