IEEE 1620.1 : 2006

IEEE 1620.1 : 2006

TEST METHODS FOR THE CHARACTERIZATION OF ORGANIC TRANSISTOR-BASED RING OSCILLATORS

Institute of Electrical & Electronics Engineers

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Table of Contents

1 Overview
  1.1 Scope
  1.2 Purpose
  1.3 Electrical characterization overview
2 Definitions, abbreviations and acronyms
  2.1 Definitions
  2.2 Acronyms
3 Standard ring oscillator characterization procedures
  3.1 Circuit layout
  3.2 Guidelines for the ring oscillator characterization process
  3.3 Other applicable standards
  3.4 Reporting data
  3.5 Environmental control and standards
Annex A (informative) Bibliography

Abstract

Specifies a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

General Product Information

Document Type Standard
Status Current
Publisher Institute of Electrical & Electronics Engineers
Supersedes
  • IEEE DRAFT 1620.1 : 0

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