IEEE 393 : 1991

IEEE 393 : 1991

TEST PROCEDURES FOR MAGNETIC CORES

Institute of Electrical & Electronics Engineers

More details

Download

PDF AVAILABLE FORMATS IMMEDIATE DOWNLOAD
$35.10

$78.00

(price reduced by 55 %)

Table of Contents

1 Scope
  1.1 Specific Types of Magnetic Cores to Which this
       Standard Applies
  1.2 Specific Applications to Which this Standard Is
       Directed
  1.3 References and Related Standards
       1.3.1 References
       1.3.2 General Related Standards
2 Definitions
3 Configurations
  3.1 Effect of the Configuration or Geometry of the
       Core Material on Finished Product
  3.2 Basic Core Shapes
  3.3 Epstein Strip Core
4 Materials
  4.1 Ferromagnetic
  4.2 Ferrites
5 Symbols and Terms
  5.1 Effective Parameters
  5.2 Permeability
       5.2.1 Initial Permeability
       5.2.2 Amplitude Permeability
       5.2.3 Maximum Permeability
       5.2.4 Incremental Permeability
       5.2.5 Pulse Permeability
       5.2.6 Complex Permeability
       5.2.7 Differential Permeability
       5.2.8 Impedance Permeability
       5.2.9 Peak Permeability
  5.3 Core Loss
       5.3.1 Specific Core Loss
  5.4 Apparent Core Loss
       5.4.1 Specific Apparent Core Loss
  5.5 Equivalent Series Circuit Elements
  5.6 Equivalent Parallel Circuit Elements
  5.7 Loss Angle (Dissipation Factor)
       5.7.1 Relative Dissipation Factor
       5.7.2 Quality Factor, Q
  5.8 Legg's Equation Parameters
  5.9 Saturation Induction, B[s]
       5.9.1 Peak Induction, B[m]
  5.10 Residual Induction, B[r]
       5.10.1 Remanent Induction
       5.10.2 Squareness Ratio
  5.11 Coercive Field or Force, H[c]
  5.12 H1 and H2 Reset Field Strengths
       5.12.1 Delta H
       5.12.2 Reset Gain, G
  5.13 Temperature Coefficient
  5.14 Temperature Factor of Permeability
  5.15 Curie Temperature or Curie Point, T[c]
  5.16 Disaccommodation
       5.16.1 Disaccommodation Factor
  5.17 Magnetic Aging
  5.18 Turns Factor
  5.19 Induction Factor, A[L]
  5.20 Volt - Second-Area
  5.21 Hysteresis Constant, eta[b]
       5.21.1 Hysteresis Core Constant, eta[i]
6 Test Methods
  6.1 Permeability Measurements
  6.2 Tests for Evaluating Cores with Pulsed
       Excitation
       6.2.1 Reference Pulse Shape
       6.2.2 Pulse Magnetization Characteristics
       6.2.3 Pulse Permeability
       6.2.4 Tests for Computer-Type Cores Used in
              Switching and Memory Applications
  6.3 Bridge Measurements
       6.3.1 Series Bridge, Low Impedance
       6.3.2 Series Bridge (Low Q)
       6.3.3 Parallel Bridge (High Q)
       6.3.4 Parallel Bridge (Low Q)
  6.4 Core Loss and Apparent Core Loss
       6.4.1 Core-Loss Measurements With Sinusoidal/Voltage
              Excitation
       6.4.2 Core-Loss Measurements in Core Excited by
              Nonsinusoidal Signals
  6.5 Saturing Core Tests
       6.5.1 Constant-Current Flux-Reset (CCFR) Core Test
              Method
       6.5.2 Sine-Current-Excitation Core Test Method
       6.5.3 Presenting Magnetic Data on Core Materials
  6.6 Methods to Obtain Hysteresis Loops and
       Magnetization Curves
       6.6.1 General Considerations
  6.7 Direct Measurement of Flux Density
       6.7.1 Hall-Effect Gaussmeter
  6.8 Dynamic Hysteresis Loop Measurement
       6.8.1 Oscilloscope Techniques
  6.9 Voltmeter - Ammeter Methods
       6.9.1 Impedance Permeability
       6.9.2 Sine-Flux Test
       6.9.3 Sine-Current Test
       6.9.4 Calculation of Mean Path Length
       6.9.5 Calculation of Flux-Path Cross-Sectional
              Area
       6.9.6 Standard Test Conditions
       6.9.7 Calculations of Induced Voltage
       6.9.8 Test Procedure
7 Bibliography
Appendix
Methods to Obtain Hysteresis Loops and Magnetization
Curves With Older Equipment
A1 Determination of the Basic Symmetrical
   Hysteresis Loop
A2 Determination of the Normal Magnetization
   Characteristic
A3 Determination of the Virgin Magnetization Curve

Abstract

Specifies applicable tests to describe the significant properties of magnetic cores used in electronic applications.

General Product Information

Document Type Standard
Status Current
Publisher Institute of Electrical & Electronics Engineers

Contact us

Cart

No products

Shipping $0.00
Total $0.00

Cart Check out

New products

  •    >>
  •    >>
  •    >>
  •    >>
  •    >>

All new products